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    Availability analysis of a repairable system with non-repairable stand-by units

    • Artículo
    • DHILLON, B. S.; B. S. Dhillon. En: Microelectron Reliability. 1976, 15, 561-562

    Graphical estimation methods for Weibull distributions

    • Artículo
    • CRAN, G. W.; G. W. Cran. En: Microelectron Reliability. 1976, 15, 47-52

    Markov renewal processes with some non regeration points and their applications to reliability theory

    • Artículo
    • NAKAGAWA, T.;OSAKI, S.; T. Nakagawa, S. Osaki. En: Microelectron Reliability. 1976, v. 15, pp. 633-636

    Reliability analysis for simple systems

    • Artículo
    • FERRIS-PRABHU, A. V.;LUBART, N. D.; A. V. Ferris-Prabhu, N. D. Lubart. En: Microelectron Reliability. 1976, 15, 555-560

    Reliability modeling algorithms for a class of large repairable

    • Artículo
    • SINGH, C.; C. Singh. En: Microelectron Reliability. 1976, 15, 159-162
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